Animations (1-1 of 1)

1. CV profile with different oxide thickness

   Animations | 20 Apr 2010 | Contributor(s):: Saumitra Raj Mehrotra, Gerhard Klimeck

   C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures.C-V measurements can...