VEDA 2.0 (Virtual Environment for Dynamic AFM)

There is a new version of this tool which can be found here: https://nanohub.org/tools/veda . Please use that tool instead

Launch Tool

This tool version is unpublished and cannot be run. If you would like to have this version staged, you can put a request through HUB Support.

Archive Version 2.0.2
Published on 08 Jun 2009, unpublished on 06 Oct 2009 All versions

doi:10.4231/D3H70805X cite this

This tool is closed source.

Category

Tools

Published on

Abstract

VEDA is a comprehensive suite of tools for simulating many different aspects of dynamic AFM under multiple environments. VEDA consists of four tools: Dynamic Approach Curves: This tool accurately simulates an AFM cantilever excited at resonance and brought towards a sample surface. Two version are available: basic and advanced. The basic tool is suitable for simulating either ambient conditions or ultra high vacuum (UHV). The advanced tool is an expanded version of the basic tool allowing both multiple eigenmode simulations as well as multiple excitation frequencies. This tool is designed specifically for simulating approach/retraction curves in liquids, bimodal excitations and internal resonance (harmonic cantilevers) applications. The model for cantilever dynamics includes a general number of eigenmodes and users are able to specify either acoustic (base) and magnetic excitation sources with single or multiple frequencies. Amplitude Modulated Scanning: is derived from Dynamic Approach Curves but is designed to simulate amplitude modulated scans over specified geometric features with heterogeneous material properties. This tool accurately simulates surface scans performed by an AFM probe controlled by amplitude modulation. Both basic and advanced versions of this tool are also available, corresponding to the same feature sets as the Dynamic Approach Curves tools. FZ Curves: uses the equations and solution procedure developed for Dynamic Approach Curves to simulate an undriven microcantilever approaching or retracting from a sample. This tool is very useful for observing bifurcations between approach and retract force, deflection, and tip-sample gap curves. Bifurcations will only be seen when a tip-sample interaction model with an attractive force component is chosen. Frequency Sweep: simulates changing the drive frequency of the cantilever. This can simulate tuning curves, as well as help to investigate the non-linear dynamics of the system. All of the VEDA tools include a variety of different tip-sample interaction models including DMT, JKR, and Hertz, as well as capillary and viscoelastic forces.

Sponsored by

  • Network for Computational Nanotechnology (NCN)
  • National Science Foundation (NSF)

References

S. Basak and A. Raman, Applied Physics Letters 91, 064107 (2007).

O. Sahin et al., Nature Nanotechnology 2, 507 (2007).

J. Melcher, X. Xu, A. Raman, Applied Physics Letters 93, 093111 (2008).

R. Proksch, Applied Physics Letters 89, 113121 (2006).

J.R. Lozano et al., Physical Review Letters 1, (2008).

X. Xu et al., Physical Review Letters, (in press 2009).

Publications

J. Melcher, S. Hu, A. Raman, Review of Scientific Instruments 79, 061301 (2008).

Cite this work

Researchers should cite this work as follows:

  • John Melcher, Daniel Kiracofe, Steven Douglas Johnson, Arvind Raman (2008), "VEDA 2.0 (Virtual Environment for Dynamic AFM)," https://nanohub.org/resources/adac. (DOI: 10.4231/D3H70805X).

    BibTex | EndNote

Tags

  1. atomic force microscopy (AFM)
  2. VEDA - Virtual Environment for Dynamic AFM