Please be advised that the date of scheduled maintenance has been changed to Monday, June 17, 2024 beginning at approximately 8 am PDT/11 am EDT. Expect a minimum downtime of approximately 4 hours, barring any difficulties. All running tool sessions will expire during the maintenance window, please plan accordingly. We apologize for any inconvenience.

This page has moved to https://www.purdue.edu/discoverypark/birck

Discovery Park Birck Nanotechnology Center

Equipment

Surface Geometry Measurements

Equipment home > Characterization > Surface Geometry Measurements

Surface Geometry Measurements

Geometric characterisics of the surfaces produced by various fabrication processes such as roughness, waviness, step height, etching depth, overall surface curvature related to the residual stress. Controlling these parameters is crucial for production structures with consistent properties.

Alpha-Step IQ

Bruker GT-K1 Optical Profilometer

Thin Film Stress Machine

Inquiries or comments: jjturner@purdue.edu

Birck Nanotechnology Center
1205 West State Street
West Lafayette, IN 47907-2057