Please be advised that the date of scheduled maintenance has been changed to Monday, June 17, 2024 beginning at approximately 8 am PDT/11 am EDT. Expect a minimum downtime of approximately 4 hours, barring any difficulties. All running tool sessions will expire during the maintenance window, please plan accordingly. We apologize for any inconvenience.
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Equipment

Electrical Properties

Equipment home > Characterization > Electrical Properties

Probe

Probes are used in conjunction with semiconductor parameter analyzers, function generators, and curve tracers to electrically drive devices and measure their performance and outputs. We have probe stations in the labs and in the cleanroom.