EE 3329 - Electronic Devices Syllabus
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1 | = EE 3329 - Electronic Devices Syllabus ("Extended Play") = | |||
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2 | === The University of Texas at El Paso === | |||
3 | - | The following concepts can be part of the syllabus for the Electronic Devices (EE 3329) course. Note that the list of topics cannot be covered in a semester, it is up to the |
+ | The following concepts can be part of the syllabus for the Electronic Devices (EE 3329) course. Note that the list of topics cannot be covered in a semester, it is up to the individual instructors to choose what concepts they wish to cover.
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4 | ||||
5 | === I. Introduction to Quantum Mechanics === | |||
6 | * Principles of Quantum Mechanics | |||
7 | * Energy Quanta | |||
8 | * Wave-Particle Duality | |||
9 | * The Uncertainty Principle | |||
10 | - | * |
+ | * Schrödinger’s Wave Equation
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11 | * The Wave Equation | |||
12 | * Physical Meaning of the Wave Function | |||
13 | * Boundary Conditions | |||
14 | - | * Applications of |
+ | * Applications of Schrödinger’s Wave Equation
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15 | * Electron in Free Space | |||
16 | * The Infinite Potential Well | |||
17 | * The Step Potential Function | |||
18 | * The Potential Barrier | |||
19 | === II. Introduction to the Quantum Theory of Solids === | |||
20 | * Allowed and Forbidden Energy Bands | |||
21 | * Formation of Energy Bands | |||
22 | * The Kronig-Penney Model | |||
23 | * The k-Space Diagram | |||
24 | * Electrical Conduction in Solids | |||
25 | * The Energy Band and the Bond Model | |||
26 | * Drift Current | |||
27 | * Electron Effective Mass | |||
28 | * Concept of the Hole | |||
29 | * Metals, Insulators, and Semiconductors'' | |||
30 | === III. Metal-Semiconductor and Semiconductor Heterojunctions === | |||
31 | * Heterojunctions | |||
32 | * Heterojunction Materials | |||
33 | * Energy-Band Diagrams | |||
34 | * Two-Dimensional Electron Gas | |||
35 | * Equilibrium Electrostatics | |||
36 | * Current-Voltage Characteristics | |||
37 | === IV. Semiconductors: A General Introduction === | |||
38 | * General Material Properties | |||
39 | * [SemiconductorsCompositionLesson Composition] | |||
40 | * Purity | |||
41 | * [SemiconductorsStructureLesson Structure] | |||
42 | * [CrystallineStructure Crystal Structure] | |||
43 | * The Unit Cell Concept | |||
44 | * Simple 3-D Unit Cells | |||
45 | * Semiconductor Lattices | |||
46 | * Miller Indices | |||
47 | * Crystal Growth | |||
48 | * Obtaining Ultrapure Si | |||
49 | * Single-Crystal Formation | |||
50 | * Summary | |||
51 | === V. Carrier Modeling === | |||
52 | * Semiconductor Models | |||
53 | * [BondingModelLesson Bonding Model] | |||
54 | * [TheEnergyBandModelLesson Energy Band Model] | |||
55 | * [CarriersinSemiconductorsLesson Carriers] | |||
56 | * [TheBandGapEnergyandMaterialClassificationLesson Band Gap Energy and Material Classification] | |||
57 | * Carrier Properties | |||
58 | * Charge | |||
59 | * Effective Mass | |||
60 | * Carrier Numbers in Intrinsic Material | |||
61 | * Manipulation of Carrier Numbers – Doping | |||
62 | * Carrier-Related Terminology | |||
63 | * State and Carrier Distributions | |||
64 | * [DensityofStatesLesson Density of States] | |||
65 | * [TheFermiFunction The Fermi Function] | |||
66 | * Equilibrium Distribution of Carriers | |||
67 | * [EquilibriumCarrierConcentrationsLesson Equilibrium Carrier Concentrations] | |||
68 | * Formulas for ''n'' and ''p'' | |||
69 | * Alternative Expressions for ''n'' and ''p'' | |||
70 | * ''n'',,i,, and ''np'' Product | |||
71 | * Charge Neutrality Relationship | |||
72 | * Carrier Concentration Calculations | |||
73 | * Determination of E,,F,, | |||
74 | * Carrier Concentration Temperature Dependence | |||
75 | === VI. Carrier Action === | |||
76 | * [DriftLesson Drift] | |||
77 | * Definition – Visualization | |||
78 | * [DriftCurrentLesson Drift Current] | |||
79 | * [MobilityandScatteringLesson Mobility and Scattering] | |||
80 | * Resistivity | |||
81 | * [BandBendingandPotentialKineticEnergiesLesson Band Bending] | |||
82 | * [DiffusionLesson Diffusion] | |||
83 | * Definition – Visualization | |||
84 | * Hot-Point Probe Measurement | |||
85 | * Diffusion and Total Currents[[BR]]Diffusion Currents [[BR]]Total Currents | |||
86 | * Relating Diffusion Coefficients/Mobilities[[BR]]Constancy of the Fermi Leve[[BR]]Current Flow Under Equilibrium Conditions[[BR]]Einstein Relationship | |||
87 | * [RecombinationofElectronsLesson Recombination – Generation] | |||
88 | * Definition – Visualization[[BR]]Band-to-Band Recombination[[BR]]R-G Center Recombination[[BR]]Auger Recombination[[BR]]Generation Process | |||
89 | * Equations of State | |||
90 | * [ContinuityEquationsLesson Continuity Equations] | |||
91 | * [TheOneDimensionalMinorityCarrierDiffusionEquations Minority Carrier Diffusion Equations] | |||
92 | * [SimplifyingtheMinorityCarrierDiffusionEquationsLesson Simplifications and Solutions] | |||
93 | * Problem Solving[[BR]]Sample Problem No. 1[[BR]]Sample Problem No. 2 | |||
94 | * Supplemental Concepts | |||
95 | * [DiffusionLengthsLesson Diffusion Lengths] | |||
96 | * [QuasiFermiLevelsLesson Quasi-Fermi Levels] | |||
97 | === VII. ''pn'' Junction Electrostatics === | |||
98 | * Quantitative Electrostatic Relationships | |||
99 | * Assumptions/Definitions | |||
100 | * Step Junction with V,,A,, = 0[[BR]]Solution for p[[BR]]Solution for E[[BR]]Solution for V[[BR]]Solution for x,,n,, and x,,p,, | |||
101 | * Step Junction with V,,A,, ≠ 0 | |||
102 | * Examination/Extrapolation of Results | |||
103 | * Linearly Graded Junctions | |||
104 | === VIII. ''pn'' Junction Diode: I-V Characteristics === | |||
105 | * [TheIdealDiodeEquationLesson The Ideal Diode Equation] | |||
106 | * [PNJunctionQualitativeAnalysisLesson Qualitative Derivation] | |||
107 | * Quantitative Solution Strategy[[BR]]General Considerations[[BR]]Quasineutral Regional Considerations[[BR]]Depletion Region Considerations[[BR]]Boundary Conditions[[BR]]“Game Plan” Summary | |||
108 | * Derivation from the Ideal | |||
109 | * Ideal Theory Versus Experiment | |||
110 | * Reverse-Bias Breakdown[[BR]]Avalanching[[BR]]Zener Process | |||
111 | * The R-G Current | |||
112 | * V,,A,, -> V,,bi,, High-Current Phenomena[[BR]]Series Resistance[[BR]]High-Level Injection | |||
113 | === IX. BJT Fundamentals === | |||
114 | * Electrostatics[[BR]] | |||
115 | * Introductory Operational Considerations[[BR]] | |||
116 | * Performance Parameters | |||
117 | * Emitter Efficiency | |||
118 | * Base Transport Factor | |||
119 | * Common Base d.c. Current Gain | |||
120 | * Common Emitter d.c. Current Gain | |||
121 | === X. BJT Static Characteristics === | |||
122 | * Ideal Transistor analysis | |||
123 | * Solution Strategy[[BR]]Basic Assumptions[[BR]]Notation[[BR]]Diffusion Equations/Boundary Conditions[[BR]]Computational Relationships | |||
124 | * General Solution (''W'' Arbitrary)[[BR]]Emitter/Collector Region Solutions[[BR]]Base Region Solution[[BR]]Performance Parameters/Terminal Currents | |||
125 | * Simplified Relationships[[BR]]Δ''p'',,B,,(x) in the Base[[BR]]Performance Parameters | |||
126 | * Ebers – Moll Equations and Model | |||
127 | * Deviations from the Ideal | |||
128 | * Ideal Theory/Experiment Comparison | |||
129 | * Base Width Modulation | |||
130 | * Punch-Through | |||
131 | * Avalanche Multiplication and Breakdown[[BR]]Common Base[[BR]]Common Emitter | |||
132 | * Geometrical effects[[BR]]Emitter Area ≠ Collector Area[[BR]]Series Resistances[[BR]]Current Crowding | |||
133 | * Recombination – Generation Current | |||
134 | * Graded Base | |||
135 | * Figure of Merit | |||
136 | === XI. MOS Fundamentals === | |||
137 | * Ideal Structure Definition[[BR]] | |||
138 | * Electrostatics – Mostly Qualitative | |||
139 | * Visualization Aids[[BR]]Energy Band Diagram[[BR]]Block Charge Diagrams | |||
140 | * Effect of an Applied Bias[[BR]]General Observations[[BR]]Specific Biasing Regions | |||
141 | * Electrostatics – Quantitative Formulation | |||
142 | * Semiconductor Electrostatics[[BR]]Preparatory Considerations[[BR]]Delta-Depletion Solution | |||
143 | * Gate Voltage Relationship | |||
144 | * Capacitance – Voltage Characteristics | |||
145 | * Theory and Analysis[[BR]]Qualitative Theory[[BR]]Delta – Depletion Analysis | |||
146 | * Computations and Observations[[BR]]Exact Computations[[BR]]Practical Observations | |||
147 | === XII. MOSFETs – The Essentials === | |||
148 | * Qualitative Theory of Operation[[BR]] | |||
149 | * Quantitative I,,D,, – V,,D,, Relationships | |||
150 | * Preliminary Considerations[[BR]][TheThresholdVoltageLesson Threshold Voltage][[BR]][EffectiveMobilityLesson Effective Mobility] | |||
151 | * [SquareLawTheoryLesson Square-Law Theory] | |||
152 | * [BulkChargeTheoryLesson Bulk-Charge Theory] | |||
153 | * Charge-Sheet and Exact-Charge Theories | |||
154 | === XIII. Nonideal MOS === | |||
155 | * Metal-Semiconductor Workfunction Difference[[BR]] | |||
156 | * Oxide Charges | |||
157 | * General Information | |||
158 | * Mobile Ions | |||
159 | * The Fixed Charge | |||
160 | * Interfacial Traps | |||
161 | * Induced Charges[[BR]]Radiation Effects[[BR]]Negative-Bias Instability | |||
162 | * ΔV,,G,, Summary | |||
163 | * MOSFET Threshold Considerations | |||
164 | * V,,T,, Relationships[[BR]] | |||
165 | * Threshold, Terminology, and Technology[[BR]] | |||
166 | * Threshold Adjustment[[BR]] | |||
167 | * Back Biasing[[BR]] | |||
168 | * Threshold Summary[[BR]][[BR]] |