NCN Nanoelectronics: Simulation Tools for Research
- This resource has a 5.3 Ranking
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Usage Stats Last 12 Months: updated 01 Oct, 2008 Users: 154 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
154 users
| Contributor(s) | |
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| Abstract | Many simulation tools are available on the nanoHUB. The tools have been well-tested and here include supporting materials so that they can be effectively used for education or intelligently used for research. The research tools include a first time users guide and supporting publications and theses.
Click here for a list of recommended simulation tools for education. |
| Cite this work | If you reference this work in a publication, please cite as follows: |
| Date posted | 28 Nov, 2007 |
| Type | Series |
| Tags |
In This Series
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Band Structure Lab
- This resource has a 10.0 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 1887 Jobs: 13373 Avg. exec. time: 8 mins Reviews & Citations Google/IEEE: updated 15 Apr, 2008 Avg. Review: Citations: 7
1887 users, detailed statistics
19 May. 2006 | Tools | Contributor(s): Abhijeet Paul, Mathieu Luisier, Neophytos Neophytou, Raseong Kim, Michael McLennan, Mark Lundstrom, Gerhard Klimeck
Computes the electronic structure of various materials in the spatial configuration of bulk (infinitely periodic), quantum wells (confined in one dimension, infinitely periodic in 2 dimensions), and wires (confined in 2 dimensions and infinitely periodic i
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Schred
- This resource has a 9.7 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 1336 Jobs: 31948 Avg. exec. time: 52 secs Reviews & Citations Google/IEEE: updated 13 Jun, 2008 Avg. Review: Citations: 80
1336 users, detailed statistics
09 Feb. 2006 | Tools | Contributor(s): Dragica Vasileska, Shaikh S. Ahmed, Matteo Mannino, Akira Matsudaira, Gerhard Klimeck, Mark Lundstrom
Calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS (Metal-Oxide-Semiconductor) or SOS (Semiconductor-Oxide- Semiconductor) structure and a typical SOI structure
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CNTbands 2.0
- This resource has a 9.0 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 1912 Jobs: 18408 Avg. exec. time: 28 secs Reviews & Citations Google/IEEE: updated 28 Apr, 2008 Avg. Review: Citations: 10
1912 users, detailed statistics
14 Dec. 2006 | Tools | Contributor(s): Youngki Yoon, James K Fodor, Jing Guo, Akira Matsudaira, Diego Kienle, Gengchiau Liang, Gerhard Klimeck, Mark Lundstrom
CNTbands v2.0 can simulate electronic band structure and density-of-states for carbon nanotubes (CNTs) and carbon nanoribbons (CNRs). It also computes some basic parameters, such as nanotube diameter, number of hexagons in the unit cell, band gap, etc. Users may select the CNR structure to be …
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PETE: Purdue Exploratory Technology Evaluator
- This resource has a 8.5 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 115 Jobs: 3652 Avg. exec. time: 3 mins Reviews & Citations Google/IEEE Avg. Review: Citations: 0
115 users, detailed statistics
27 Jun. 2007 | Tools | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy
Using PETE one can evaluate any MOSFET like devices or any New Devices in terms of performance on Benchmark circuits. The input to the tool can be in terms of typical MOSFET parameters or in terms of I-V and C-V tables. The Benchmark circuits include minim
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NanoMOS
- This resource has a 7.9 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 1123 Jobs: 10985 Avg. exec. time: 16 mins Reviews & Citations Google/IEEE: updated 03 Jun, 2008 Avg. Review: Citations: 51
1123 users, detailed statistics
19 May. 2006 | Tools | Contributor(s): Zhibin Ren, Sebastien Goasguen, Akira Matsudaira, Shaikh S. Ahmed, Kurtis Cantley, Mark Lundstrom
2-D simulator for thin body (less than 5 nm), fully depleted, double-gated n-MOSFETs
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Device Reliability Tool
- This resource has a 6.3 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 193 Jobs: 775 Avg. exec. time: 57 secs Reviews & Citations Google/IEEE: updated 05 Feb, 2008 Avg. Review: Citations: 1
193 users, detailed statistics
28 Aug. 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam
Analyzes MOS device reliability based on Negative Bias Temperature Instability (NBTI).
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NanoNET
- This resource has a 5.6 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 07 Oct, 2008 Users: 338 Jobs: 1817 Avg. exec. time: 14 mins Reviews & Citations Google/IEEE: updated 22 Apr, 2008 Avg. Review: Citations: 3
338 users, detailed statistics
17 Jan. 2007 | Tools | Contributor(s): Ninad Pimparkar, Satish Kumar, Jayathi Murthy, Muhammad A. Alam
NanoNET is a tool to simulate the Nanobundle Network Thin Film Transistors (NB-TFTs). Random networks of carbon nanotubes with thousands of tubes and random orientation can be simulated using this tool. The final answer can be compactly formulated in the formula shown in the picture. Here ID is …
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- 0.0 Ranking Topic NCN Nanoelectronics
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