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VEDA: Amplitude Modulated Scanning
- This resource has a 7.4 Ranking
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Usage Stats Overall Period: Updated 06 Oct, 2008 Users: 220 Jobs: 2777 Avg. exec. time: 3 mins Reviews & Citations Google/IEEE: updated 28 Apr, 2008 Avg. Review: Citations: 1
220 users, detailed statistics
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This tool is closed source.
Available Versions
- 1.0 (published)
- 1 (unpublished)
Supporting Documents
- Manual (PDF, 2.7 Mb)
| Version | 1.0 - published on 02 Jul, 2008 |
|---|---|
| Contributor(s) | John Melcher, Shuiqing Hu, Arvind Raman Purdue University, West Lafayette |
| At a glance | Simulates amplitude modulated AFM scans over specified geometric feature with heterogeneous material properties. |
| Screenshots | |
| Description | The Amplitude Modulated Scanning addition to VEDA is designed to simulate amplitude modulated scans over specified geometric features with heterogeneous material properties. This tool accurately simulates surface scans performed by an AFM probe controlled by amplitude modulation in either ambient conditions or ultra high vacuum (UVH). The Amplitude Modulated Scanning tool features (a) accurate models of microcantilever dynamics, (b) realistic tip-sample interaction force models, (c) accurate, FORTRAN-based, numerical integration schemes that are well-suited for non-smooth, nonlinear differential equations, and (d) realistic controller dynamics based on amplitude error signal feedback. |
| Credits | This work was funded by the Network for Computational Nanotechnology (NCN). |
| References | |
| Cite this work | If you reference this work in a publication, please cite as follows:
In addition, we would appreciate it if you would add the following acknowledgment to your publication:
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| Type | Tools |
| Tags |
Citations
The following are publications that have cited this resource, separated by their affiliation to the NCN.
Affiliated authors
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Raman, A.; Melcher, J.; Rung, R. (2008), "Cantilever Dynamics in Atomic Fore Microscopy," nanotoday, 3, 1-2: pg. 20-27, 04.
Raman, A.; Melcher, J.; Rung, R. (2008), "Cantilever Dynamics in Atomic Fore Microscopy," nanotoday, 3, 1-2: pg. 20-27, 04.
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6.8 Ranking Series
Part of: NCN NEMS: Simulation Tools for Education and Research
NCN NEMS: Simulation Tools for Education and Research
Many simulation tools are available on the nanoHUB. The tools have been well-tested and here include supporting materials so that they can be effectively used for education or intelligently used for research.
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