Courses (1-4 of 4)

1. Device Characterization with the Keithley 4200-SCS

   Courses | 20 Jan 2011 | Contributor(s):: Lee Stauffer

   This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

2. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

   Courses | 01 Sep 2010 | Contributor(s):: Ron Reifenberger, Arvind Raman

   Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

3. Colloquium on Graphene Physics and Devices

   Courses | 22 Sep 2009 | Contributor(s):: Joerg Appenzeller, Supriyo Datta, Mark Lundstrom

   This short course introduces students to graphene as a fascinating research topic as well as to develop their skill in problem solving using the tools and techniques of electronics from the bottom up.

4. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

   Courses | 03 Sep 2009 | Contributor(s):: Ron Reifenberger, Arvind Raman

   A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.