Tags: atomic force microscopy (AFM)

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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. ME 597 Lecture 12: Introduction to Dynamic AFM – Point Mass Approximation

    Online Presentations | 01 Nov 2009 | Contributor(s):: Arvind Raman

  2. ME 597 Lecture 6: The Transition from STM to AFM

    Online Presentations | 26 Oct 2009 | Contributor(s):: Ron Reifenberger

  3. VEDA: Amplitude Modulated Scanning

    Tools | 20 Oct 2009 | Contributor(s):: John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe

    This tool is being replaced by VEDA 2.0. Use that tool instead.

  4. Katie M Smith

    https://nanohub.org/members/38245

  5. ME 597 Lecture 2: Electron States in Solids-Density of States

    Online Presentations | 09 Sep 2009 | Contributor(s):: Ron Reifenberger

    Note: This lecture has been revised since its original presentation.Topics:Electron States in Solids – Bloch FunctionsKronig-Penney ModelDensity of States

  6. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    Courses | 03 Sep 2009 | Contributor(s):: Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

  7. ME 597 Lecture 1: Introduction to Basic Quantum Mechanics

    Online Presentations | 01 Sep 2009 | Contributor(s):: Ron Reifenberger

    Note: This lecture has been revised since its original presentation.Topics:Introduction to Basic Quantum MechanicsEnergy States in Periodic Crystals

  8. ME 597 Introductory Lecture

    Online Presentations | 01 Sep 2009 | Contributor(s):: Ron Reifenberger

  9. Nanotribology, Nanomechanics and Materials Characterization Studies

    Online Presentations | 08 Jun 2009 | Contributor(s):: Bharat Bhushan

    Fundamental nanotribological studies provide insight to molecular origins of interfacial phenomena including adhesion, friction, wear and lubrication. Friction and wear of lightly loaded micro/nano components are highly dependent on the surface interactions (few atomic layers). Nanotribological...

  10. ECET 499N: Introduction to Nanotechnology

    Courses | 30 Mar 2009 | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  11. AFM imaging of bare silicon surface to measure its rms roughness

    Q&A|Open | Responses: 1

    Dear Friends,

    my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....

    https://nanohub.org/answers/question/242

  12. Images for AFM

    Presentation Materials | 17 Feb 2009 | Contributor(s):: yan zhang

  13. VEDA 2.0 (Virtual Environment for Dynamic AFM)

    Tools | 28 Aug 2008 | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Arvind Raman

    There is a new version of this tool which can be found here. Please use that tool instead

  14. Dr. Heinz Sturm

    https://nanohub.org/members/32408

  15. Gas Damping of Microcantilevers at Low Ambient Pressures

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    Online Presentations | 03 Nov 2008 | Contributor(s):: Rahul Anil Bidkar

    This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a...

  16. SUGARCube - Cantilever

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    Tools | 01 May 2008 | Contributor(s):: Fengyuan Li, Brandon Patterson, Jason Clark, yi zeng

    Cantilever modeling and simulation with different loads

  17. So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?

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    Online Presentations | 11 Sep 2008 | Contributor(s):: Kunal Bose

  18. BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers

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    Online Presentations | 04 Jun 2008 | Contributor(s):: Don Bergstrom

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  19. SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM

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    Online Presentations | 05 Jan 2007 | Contributor(s):: Tomasz Kowalewski

    Tapping mode atomic force microscopy (TMAFM) in fluids has become an increasingly important technique, especially in studying biological samples under near physiological conditions. However, until recently the physics of tapping mode operation under fluids has not been well understood. The first...

  20. SPMW Single molecule recognition atomic force microscopy

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    Online Presentations | 05 Jan 2007 | Contributor(s):: Peter Hinterdorfer

    In molecular recognition force microscopy (MRFM), ligands are covalently attached to atomic force microscopy tips for the molecular recognition of their cognitive receptors on probe surfaces. A ligand-containing tip is approached towards the receptors on the probe surface, which possibly leads to...