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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods
Courses|' 24 Jul 2013
A two-part series of online courses covering the principles and practice of atomic force microscopy.
https://nanohub.org/courses/AFM2