Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Members (21-32 of 32)

  1. Tewfik Souier

    https://nanohub.org/members/73657

  2. Alok Ranjan

    https://nanohub.org/members/71877

  3. Filippo Mangolini

    https://nanohub.org/members/71694

  4. Brad Weedon

    https://nanohub.org/members/69741

  5. Nano fundao

    Nanotechnology student 3rd year.

    https://nanohub.org/members/69058

  6. Janusz Strzelecki

    https://nanohub.org/members/60630

  7. Tejasvi Parupudi S V R V

    Graduate Student working on AFM. Interested in BioMEMS, medical devices.

    https://nanohub.org/members/57433

  8. Vsevolod Kosulnikov

    https://nanohub.org/members/56242

  9. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...

    https://nanohub.org/members/54763

  10. Frederic Sansoz

    https://nanohub.org/members/52609

  11. Katie M Smith

    https://nanohub.org/members/38245

  12. Dr. Heinz Sturm

    https://nanohub.org/members/32408