Sending report ...Scanning Electron Microscope
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| Contributor(s) | John C. Bean University of Virginia, Charlottesville, VA |
|---|---|
| Abstract | This resource describes a scanning electron microscope (SEM). It includes detailed depictions of how the electron beam is focused and used to create hugely magnified images of experimental specimens. |
| Credits |
John Bean, University of Virginia |
| Cite this work | If you reference this work in a publication, please cite as follows: |
| Date posted | 16 Nov, 2005 |
| Type | Animations |
| Tags |
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