Quantum and Semi-classical Electrostatics Simulation of SOI Trigates
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Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 80 Jobs: 243 Avg. exec. time: 4 mins Reviews & Citations Google/IEEE Avg. Review: Citations: 0
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- 2.0 (published)
- 1.9 (unpublished)
- 1.0 (unpublished)
| Version | 2.0 - published on 02 Apr, 2008 |
|---|---|
| Contributor(s) | Hyung-Seok Hahm University of Illinois, Urbana-Champaign Andres Godoy University of Granada, Spain |
| At a glance | Generate classical and quantum electrostatic simulation results in a SOI Trigate geometry |
| Description | The application was originally written in Matlab by Andres Godoy at University of Granada, Spain, and later rappturized by Hyung-Seok Hahm at University of Illinois at Urbana-Champaign. It generates both quantum mechanical and classical electrostatic simulation results in a cross section (perpendicular to the transport direction) for two dimensional (2D) Trigate structures. 2D Poisson and Schroedinger equations are self-consistenly solved for this kind of devices. The user can select the dimensions of the silicon width (WSi), height (HSi), the gate oxide thickness (Tox) and the buried oxide thickness (TBox), and the applied gate voltage (Vg). Other important simulation conditions are - Room temperature: 300K The current version provides the following results: - Classical Electron Density In case you include a simulation result in your publication, please cite the tool as the following: * Electrostatic simulation of SOI Trigates at http://www.nanohub.org by Hyung-Seok Hahm and Andres Godoy * F.J. Garcia Ruiz, A. Godoy, F. Gamiz, C. Sampedro, and L. Donetti, “A Comprehensive Study of the Corner Effects in Pi-Gate MOSFETs Including Quantum Effects” IEEE Trans. Electron Devices, vol. 54(12), pp. 3369-3377, 2007. |
| Credits | Hyung-Seok Hahm, University of Illinois at Urbana-Champaign Andres Godoy at University of Granada, Spain |
| References | F.J. Garcia Ruiz, A. Godoy, F. Gamiz, C. Sampedro, and L. Donetti, “A Comprehensive Study of the Corner Effects in Pi-Gate MOSFETs Including Quantum Effects” IEEE Trans. Electron Devices, vol. 54(12), pp. 3369-3377, 2007. |
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