Sending report ...VEDA: Amplitude Modulated Scanning
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Usage Stats Last 12 Months: Updated 16 May, 2008 more › Users: 118 Jobs: 517 Avg. exec. time: 3 mins Reviews & Citations Google/IEEE: updated 28 Apr, 2008 Avg. Review: Citations: 1
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Supporting Documents
- User's Guide for VEDA: Amplitude Modulated Scanning (PDF, 2.7 Mb)
| Contributor(s) | John Melcher, Shuiqing Hu, Arvind Raman Purdue University, West Lafayette |
|---|---|
| At a glance | Simulates amplitude modulated AFM scans over specified geometric features with heterogeneous material properties. |
| Screenshots | |
| Description | The Amplitude Modulated Scanning addition to VEDA is designed to simulate amplitude modulated scans over specified geometric features with heterogeneous material properties. This tool accurately simulates surface scans performed by an AFM probe controlled by amplitude modulation in either ambient conditions or ultra high vacuum (UVH). The Amplitude Modulated Scanning tool features (a) accurate models of microcantilever dynamics, (b) realistic tip-sample interaction force models, (c) accurate, FORTRAN-based, numerical integration schemes that are well-suited for non-smooth, nonlinear differential equations, and (d) realistic controller dynamics based on amplitude error signal feedback. |
| Credits | This work was funded by the Network for Computational Nanotechnology (NCN). |
| References | |
| Cite this work | If you reference this work in a publication, please cite as follows:
In addition, we would appreciate it if you would add the following acknowledgment to your publication:
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| Date posted | 30 Apr, 2007 |
| Type | Tools |
| Tags |
Citations
The following are publications that have cited this resource, separated by their affiliation to the NCN.
Affiliated authors
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Raman, A.; Melcher, J.; Rung, R. (2008), "Cantilever Dynamics in Atomic Fore Microscopy", nanotoday, 3, 1-2: pg. 20-27, February-April.
Raman, A.; Melcher, J.; Rung, R. (2008), "Cantilever Dynamics in Atomic Fore Microscopy", nanotoday, 3, 1-2: pg. 20-27, February-April.
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