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What Can the TEM Tell You About Your Nanomaterial?

This resource has a 9.8 Ranking

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Last 12 Months: updated 01 Aug, 2008
Users: 169
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Avg. Review: 5.0 out of 5 stars
Citations: 0

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Contributor(s) Eric Stach
Purdue University, West Lafayette
Abstract In this tutorial, I will present a brief overview of the ways that transmission electron microscopy can be used to characterize nanoscale materials. This tutorial will emphasize what TEM does well, as well where difficulties arise. In particular, I will discuss in an overview manner how diffraction, imaging and spectroscopy function in the TEM, and how these techniques can be combined to provide a detailed characterization of nanoscale structures. Some emphasis on sample preparation requirements, image artifacts and low sampling statistics will be detailed as well. I hope that at the end of this brief tutorial, you will have a better sense as to when the TEM might help you answer particular questions in your research.
Sponsored by NCN@Purdue Student Leadership Team
Network for Computational Nanotechnology
The Institute for Nanoelectronics and Computing
Cite this work

If you reference this work in a publication, please cite as follows:

  • Stach, Eric (2007), "What Can the TEM Tell You About Your Nanomaterial?," http://www.nanohub.org/resources/2359/.

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Date posted 26 Feb, 2007
Time 02:00 PM, January 31, 2007
Location EE 317, Purdue University, West Lafayette, IN
Type Online Presentations
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  1. 5.0 out of 5 stars 

    Posted on 28 February, 2007 by Martin G. Smith

    Excellent presentation for my Crew of knowledge seekers

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