Online Simulation

And More

Top 25 Tags (all tags)

  1. algorithms
  2. carbon nanotubes
  3. circuits
  4. course lecture
  5. cyberinfrastructure
  6. devices
  7. education/outreach
  8. experiments
  9. material science
  10. molecular electronics
  11. nano/bio
  12. nanobio applications
  13. nano electro-mechanical systems
  14. nanoelectronics
  15. nanomedicine
  16. nanophotonics
  17. nano-transistors
  18. nanowires
  19. NEGF
  20. quantum dots
  21. research seminar
  22. SURI
  23. tutorial
  24. uIllinois
  25. uiuc

Other

Trouble Report

For immediate assistance browse through our support center. You can find answers to many questions in just a few minutes.

If still experiencing problems, send us a report.

Sending report ...

Frontiers in Scanning Probe Microscopy

This resource has a 10.0 Ranking

Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

Usage Stats
Last 12 Months: updated 01 May, 2008
Users: 325
Reviews & Citations
Google/IEEE
Avg. Review: 0.0 out of 5 stars
Citations: 0

0 reviews (Review this)

0 citations

Contributor(s)
Abstract

image From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.

The three day workshop featured thematically arranged invited talks. The workshop themes are broadly divided into (a) Dynamic AFM methods, (b) Dynamic AFM applications and (c) Nanomechanics. Within these themes, the invited talks covered a diverse array of topics including atomic and sub-atomic resolution imaging, scanning under liquids, dynamic AFM applications in biology, dynamic system approaches, and novel SPM probes and spectroscopies.

Workshop website: http://www.inac.purdue.edu/workshops/spm06.

Sponsored by Discovery Park
Birck Nanotechnology Center, Purdue University
School of Biomedical Engineering, Purdue University
School of Mechanical Engineering, Purdue University
NSF NCN, Purdue University
NASA INAC, Purdue University
National Science Foundation (CMS)
Army Research Office
VEECO Instruments
Cite this work

If you reference this work in a publication, please cite as follows:

  • (2007), "Frontiers in Scanning Probe Microscopy", http://www.nanohub.org/resources/2035/, accessed on 2008-05-17 04:29:03.

    BibTex | EndNote

Date posted 12 Feb, 2007
Type Workshops
Tags

In This Series

  1. SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers

    This resource has a 6.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 35
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    12 Feb. 2007 | Online Presentations | Contributor(s): Sergei Magonov, Sergey Belikov

    High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet quantitative …

  2. SPMW Nanomechanics: from nanotechnology to biology

    This resource has a 7.2 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 51
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    08 Feb. 2007 | Online Presentations | Contributor(s): Elisa Riedo

    The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and transports, as well as smarter and smaller nanodevices for biomedical applications. To reach these …

  3. SPMW Mechanisms of atomic friction studied by friction force microscopy

    This resource has a 6.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 44
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    13 Jan. 2007 | Online Presentations | Contributor(s): Ernst Meyer

    Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be shown that atomic-scale stick-slip is relatively well understood, where the dependence on velocity …

  4. SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex

    This resource has a 6.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 34
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    08 Feb. 2007 | Online Presentations | Contributor(s): J. P. Aimé

    …

  5. SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM

    This resource has a 9.9 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 184
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    11 May. 2007 | Online Presentations | Contributor(s): Ricardo Garcia

    Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single biomolecules in their natural environment [1]. The ability of AM-AFM to separate topography from …

  6. SPMW Single molecule recognition atomic force microscopy

    This resource has a 5.9 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 15
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    08 Jan. 2008 | Online Presentations | Contributor(s): Peter Hinterdorfer

    …

  7. SPMW Scanning Impedance Microscopy: probing local electronic structure and transport anomalies

    This resource has a 6.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 17
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    08 Jan. 2008 | Online Presentations | Contributor(s): Dawn Bonnell

    …

  8. SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution

    This resource has a 6.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 36
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    03 Jul. 2007 | Online Presentations | Contributor(s): Udo D. Schwarz

    …

  9. SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM

    This resource has a 6.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 23
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    09 Jan. 2008 | Online Presentations | Contributor(s): Tomasz Kowalewski

    …

  10. SPMW FIRAT: A fast and sensitive probe structure for SPM

    This resource has a 6.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 39
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    08 May. 2007 | Online Presentations | Contributor(s): F. Levent Degertekin

    …

  11. SPMW Nonlinear dynamics in AFM - chaos and parametric resonance

    This resource has a 6.5 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 37
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    08 Feb. 2007 | Online Presentations | Contributor(s): Arvind Raman

    The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM [1] are becoming increasingly clear. Nonlinear …

  12. SPMW AFM at Video Rate and Beyond

    This resource has a 5.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: updated 01 May, 2008
    Users: 24
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    0 reviews (Review this)

    0 citations

    16 May. 2007 | Online Presentations | Contributor(s): Mervyn Miles

    The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional instruments in which each image requires typically a minute or more to collect. This has two major detrimental …

Citations

The following are publications that have cited this resource, separated by their affiliation to the NCN.

No citations found.

Reviews

The following are reviews of this resource from other site members.

Write a review

No reviews found. Be the first to review this resource!