Online Simulation

And More

Top 25 Tags (all tags)

  1. 0
  2. ACUTE
  3. algorithms
  4. aqme
  5. carbon nanotubes
  6. circuits
  7. course lecture
  8. cyberinfrastructure
  9. devices
  10. education/outreach
  11. experiments
  12. material science
  13. molecular electronics
  14. nano/bio
  15. nanobio applications
  16. nano electro-mechanical systems
  17. nanoelectronics
  18. nanomedicine
  19. nanophotonics
  20. nano-transistors
  21. NEGF
  22. quantum dots
  23. quantum transport
  24. research seminar
  25. tutorial

Other

Trouble Report

For immediate assistance browse through our support center. You can find answers to many questions in just a few minutes.

If still experiencing problems, send us a report.

Sending report ...

Frontiers in Scanning Probe Microscopy

SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers

This resource has a 6.7 Ranking

Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

Usage Stats
Last 12 Months: updated 01 Oct, 2008
Users: 86
Reviews & Citations
Google/IEEE
Avg. Review: 0.0 out of 5 stars
Citations: 0

86 users

0 reviews (Review this)

0 citations

View Presentation

Supporting Documents

Contributor(s) Sergei Magonov, Sergey Belikov
Veeco Instruments
Abstract High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet quantitative analysis of these properties remains a challenging issue. The same is true for nanoindentation studies, which complement the main AFM functions. We believe that advances in high-resolution imaging and nanomechanical analysis should be based on a rigorous interplay between theory and experiment. For this purpose, KBM (Krylov-Bogoliubov-Mitropolsky) modeling of tapping mode AFM was performed and applied for analysis of the experimental data. In the first step, a simulation of AFM imaging of molecular lattices and defects was performed for polydiacetylene crystal and compared with experimental images obtained on this sample[1,2]. This comparison suggests that an extreme care should be taken in the analysis of the molecular- and atomic-scale images to avoid misleading conclusions. In the second step, we performed the analysis of experimental amplitude and phase curves and phase images of polymer blends. The KBM model describes tapping mode amplitude and phase curves in terms of three stationary solutions (two stable nodes, one saddle) verified by the experiments. A simple model of energy dissipation (adhesion avalanche) was also considered. Different phase and dissipation contrast of images of multilayer polymer blends suggests that phase imaging is better for compositional mapping whereas understanding of the dissipative processes is indispensable for a quantitative description of tip-sample forces[3]. Further steps in the development of this interplay include an extension of KBM to frequency modulation mode and a consideration of force models describing a transition from Lennard-Jones solid to elastic solid [4].
Credits This work was supported by NIST/ATP Award #70NANB4H3055.
References
  1. D. Klinov, S. Magonov APL (2004) 84, 2697
  2. S. Belikov, S. Magonov JJAP (2006) 45, 2158
  3. S. Belikov, N. Yerina, and S. Magonov, submitted to J. Physics (2006).
  4. D. Maugis “Contact, adhesion and rupture of elastic solid� (2000) Springer, Heidelberg.
Cite this work

If you reference this work in a publication, please cite as follows:

  • Magonov, Sergei; Belikov, Sergey (2007), "SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers," http://www.nanohub.org/resources/2030/.

    BibTex | EndNote

Date posted 12 Feb, 2007
Time 04:00 PM, October 04, 2006
Location Burton Morgan Building, Purdue University, West Lafayette, IN
Type Online Presentations
Tags

Citations

The following are publications that have cited this resource, separated by their affiliation to the NCN.

No citations found.

Reviews

The following are reviews of this resource from other site members.

Write a review

No reviews found. Be the first to review this resource!

See also

The following are resources that may cover similar or related topics.

  • 10.0 Ranking Workshops Part of: Frontiers in Scanning Probe Microscopy

    Frontiers in Scanning Probe Microscopy

    Type Workshops
    Date 12 Feb, 2007
    Avg. Rating 0.0 out of 5 stars  (0)
    Rate this

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world. The three day workshop featured thematically arranged invited talks. The workshop themes are …

People who looked at this also looked at:

Network Recommendations powered by CIKNOW developed by the Science of Networks in Communities Research (SONIC) group at Northwestern University.

Recommendations will load momentarily. If you do not see content change after 30 seconds, there may be a number of reasons:

  • You have javascript turned off in your browser.
  • You have browser incapable of handling the scripts that load the recommendations.
  • There is a problem with the recommendation service and it failed to respond.