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Nanotechnology 501 Lecture Series

Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology

This resource has a 9.8 Ranking

Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

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Last 12 Months: updated 01 Aug, 2008
Users: 307
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Google/IEEE
Avg. Review: 5.0 out of 5 stars
Citations: 0

307 users

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Contributor(s) Eric Stach
Purdue University, West Lafayette
Abstract

Electron and ion microscopy techniques allow one to obtain high spatial resolution images and spectroscopic information of both the surface and internal structure of nanostructured materials. In this tutorial, I will present a broad overview of the basic physical principles that underly the techniques of scanning electron microscopy, focused ion beam microscope and transmission electron microscopy, and present copious examples from both my own work and the literature regarding how these techniques can applied to understand processing / structure / property relationships in nanostructured materials. The intent of the presentation is to convey a sense of the power of the techniques and how they can impact your research. Special emphasis will be placed on the capabilities (existing and planned) in the microscopy labs of the Birck Nanotechnology Center.

Biography

Professor Eric Stach received a BS degree in Mechanical Engineering and Materials Engineering from Duke University in 1992. In 1994, he received his M.S. from the University of Washington and in 1998 he received his PhD from the University of Virginia, both in Materials Science and Engineering. He joined Lawrence Berkeley National Laboratory in Berkeley, CA where he was a Materials Staff Scientist at the National Center for Electron Microscopy, and in 2003 became a Program Leader in the Metals Program, Materials Science Division. He began his career at Purdue in the School of Materials Engineering in January 2005. His research interests include high-resolution in-situ electron microscopy techniques to understand how nanometer lengths scales affect the fundamental mechanical, thermomechanical and electromechanical behavior of materials.

Sponsored by

NCN@Purdue Student Leadership Team
Network for Computational Nanotechnology
The Institute for Nanoelectronics and Computing

Cite this work

If you reference this work in a publication, please cite as follows:

  • Stach, Eric (2006), "Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology," http://www.nanohub.org/resources/1097/.

    BibTex | EndNote

Date posted 17 Mar, 2006
Time 01:30 PM, February 27, 2006
Location EE Building, Room 317
Type Online Presentations
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  1. 5.0 out of 5 stars 

    Posted on 12 March, 2008 by Bujar Qiraxhiu

See also

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  • 9.5 Ranking Series Part of: Nanotechnology 501 Lecture Series

    Nanotechnology 501 Lecture Series

    Type Series
    Date 22 Feb, 2005
    Avg. Rating 5.0 out of 5 stars  (4)
    Rate this

    Nanotechnology 501 is a series of lectures designed to provide an introduction to nanotechnology. This series is similar to our popular Nanotechnology 101 series, but directed at the graduate student/professional level.

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