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MSE 582 Transmission Electron Microscopy Skills

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Last 12 Months: updated 01 Oct, 2008
Users: 1297
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Contributor(s) Eric Stach
Purdue University, West Lafayette
Abstract Course Content:

  1. Instrumental design
    • Electron properties & sources
    • Lenses & Lens aberrations
    • Image recording system
  2. Operation of the TEM
    • Alignment & Calibration
    • Diffraction
    • Bright field imaging
    • Dark field imaging
    • Many-beam (high resolution) imaging
  3. Introduction to analysis of results - Diffraction
    • Diffraction spot patterns
    • Kikuchi patterns
    • Convergent beam patterns
  4. Introduction to analysis of results - Images
    • Two-beam images
    • Many beam images
    • Use of diffractograms

References Primary textbook: D.B. Williams and C.B. Carter, Transmission Electron Microscopy - A Textbook for Materials Science (4-Vol Set), Plenum Press, New York, ISBN: : 030645324X (paperback). Volume 1 strongly suggested.
Cite this work

If you reference this work in a publication, please cite as follows:

  • Stach, Eric (2008), "MSE 582 Transmission Electron Microscopy Skills," http://www.nanohub.org/courses/tem_skills.

    BibTex | EndNote

Date posted 28 Jan, 2008
Type Courses
Tags
Lecture Number/Topic Breeze Video Lecture Notes (PDF) Supplemental Material Suggested Exercises
MSE 582 Lecture 1: Introduction View View Notes
MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources View View Notes
MSE 582 Lecture 4: The Instrument, Part 1 View View Notes
MSE 582 Lecture 4: The Instrument, Part 2 View View Notes
MSE 582 Lecture 5: Electron Detection View View Notes
MSE 582 Lecture 6: Vacuum Science in EM View View Notes
MSE 582 Lecture 7: Sample Preperation View View Notes
MSE 582 Lecture 8: Electron Scattering View View Notes
MSE 582 Lecture 9: Diffraction View View Notes
MSE 582 Lecture 10: Diffraction Contrast Imaging View View Notes
MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM View View Notes
MSE 582 Lecture 12: Analytical Electron Microscopy View View Notes

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