ECE 695A Reliability Physics of Nanotransistors
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Week 1: Introduction to Reliability Physics
Lectures
Week 1: Supplementary Information
- Reliability from material science point of view: Why things break by M. Eberhart. Harmony Books, 2003. ISBN 1-4000-4760-9
Homework
- Homework Week 1:
Week 2: Spatial Randomness and Nature of Defects
Week 3: Interface Reliability of Semiconductor Devices: NBTI Degradation
Review Questions
Week 4: Interface Reliability of Semiconductor Devices (Continued)
Lectures
Review Questions
Week 4: Supplementary Information
Homework
Week 5: Interface Reliability of Semiconductor Devices: Hot Carrier Degradation
Lectures
Review Questions
Week 5: Supplementary Information
- Reference Paper 1: (H2-D2 Isotope Effect)
- Reference Paper 2: (Analytical Solution of Poisson Equation in 2D MOSFET)
- Reference Paper 3: (Analytical Solution to Drain Current in 2D MOSFET)
Homework
Week 6: Hot Carrier Degradation and Theory and Practice of interface Characterization Techniques
Lectures
Review Questions
Homework
- Homework Week 6:
Week 6: Supplementary Information
- Schroeder's book is a very good overall reference. A few specific papers are:
Week 7: Theory and Practice of interface Characterization Techniques
Lectures
Review Questions
Mid Term Exam
- Midterm Exam
Week 8: Time-Dependent Dielectric Breakdown
Lectures
Review Questions
Week 8: Supplementary Information
Homework
- Homework Week 8: No Homework
Week 9: Time-Dependent Dielectric Breakdown
Lectures
Review Questions:
Week 9: Supplementary Information
Homework
- Homework Week 9:
Week 10: Breakdown in Thick Dielectrics
Lectures
Review Questions
Week 11: Radiation Damage in Semiconductor Devices
Week 12: Statistics of Reliability
Lectures
Review Questions
Week 13: Statistics of Reliability (continued)
Lectures
Review Questions
Homework
- Homework Week 13
Week 14: Radiation Damage in Semiconductor Devices and Concluding Lectures
Lectures
Review Questions:
Exam
- Exams and Solutions