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Contributors: View

Haldun Kufluoglu

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Contributions 1 (detailed usage)
Affiliation Purdue University, West Lafayette

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  1. Device Reliability Tool

    This resource has a 6.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 19 Jul, 2008
    Users: 181
    Jobs: 746
    Avg. exec. time: 58 secs
    Reviews & Citations
    Google/IEEE: updated 05 Feb, 2008
    Avg. Review: 4.0 out of 5 stars
    Citations: 1

    181 users, detailed statistics

    1 review (Review this)

    1 citation

    0 questions (Ask a question)

    28 Aug. 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes MOS device reliability based on Negative Bias Temperature Instability (NBTI).

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