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Contributors: View

Shuiqing Hu

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Contributions 2 (detailed usage)
Affiliation Purdue University, West Lafayette
Biography

Shuiqing Hu is currently a doctoral student in the School of Mechanical Engineering and the Birck Nanotechnology Center at Purdue University working with Prof. Arvind Raman in the field of nonlinear dynamics in dynamic atomic force microscopy. Earlier he earned his master (2001) and bachelor's (1998) degree in acoustics from the Nanjing University, P.R. China. His reseach interests lie in predicting and exploiting nonlinear dynamical phenomena in micro and nanosystems. Shuiqing received two years Frederick N. Andrews Fellowship (2001-2003) and Purdue Research Foundation Fellowship (2003-2007) in Purdue University.

Contributions

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  1. VEDA: Amplitude Modulated Scanning

    This resource has a 7.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 06 Oct, 2008
    Users: 220
    Jobs: 2777
    Avg. exec. time: 3 mins
    Reviews & Citations
    Google/IEEE: updated 28 Apr, 2008
    Avg. Review: 0.0 out of 5 stars
    Citations: 1

    220 users, detailed statistics

    0 reviews (Review this)

    1 citation

    0 questions (Ask a question)

    30 Apr. 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson

    Simulates amplitude modulated AFM scans over specified geometric feature with heterogeneous material properties.

  2. VEDA: Dynamic Approach Curves

    This resource has a 6.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 06 Oct, 2008
    Users: 161
    Jobs: 1203
    Avg. exec. time: 3 mins
    Reviews & Citations
    Google/IEEE: updated 28 Apr, 2008
    Avg. Review: 0.0 out of 5 stars
    Citations: 3

    161 users, detailed statistics

    0 reviews (Review this)

    3 citations

    0 questions (Ask a question)

    15 Mar. 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson

    Simulates amplitude vs distance curves and interaction forces for dynamic atomic force microscopy

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Results 1 - 2 of 2