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Contributors: View

John Melcher

Contributor picture

Contributions 2
Affiliation Purdue University, West Lafayette
Biography

John is currently a doctoral student at Purdue University working with Prof. Arvind Raman in the field of nonlinear dynamics with applications in dynamic atomic force microscopy.

Contributions

  1. VEDA: Amplitude Modulated Scanning

    This resource has a 6.9 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: Updated 16 May, 2008 more ›
    Users: 118
    Jobs: 517
    Avg. exec. time: 3 mins
    Reviews & Citations
    Google/IEEE: updated 28 Apr, 2008
    Avg. Review: 0.0 out of 5 stars
    Citations: 1

    0 reviews (Review this)

    1 citation

    30 Apr. 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman

    Simulates amplitude modulated AFM scans over specified geometric features with heterogeneous material properties.

  2. VEDA: Dynamic Approach Curves

    This resource has a 6.9 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Last 12 Months: Updated 16 May, 2008 more ›
    Users: 80
    Jobs: 486
    Avg. exec. time: 2 mins
    Reviews & Citations
    Google/IEEE: updated 28 Apr, 2008
    Avg. Review: 0.0 out of 5 stars
    Citations: 3

    0 reviews (Review this)

    3 citations

    15 Mar. 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman

    Simulates the dynamics of the nanoscale tip of an oscillating AFM cantilever as it approaches a sample.