Contributors: View
Shuqing (Victor) Cao

| Contributions | 4 (detailed usage) |
|---|---|
| Affiliation | Stanford University |
| Biography | Victor is a student in Engineer's program at Stanford University. His research interests include quantum effect in device, Technology CAD application and optimization, analog circuit design, silicon process technology and compact modeling for circuit design. |
Contributions
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Process Lab: Concentration Dependent Diffusion
- This resource has a 9.0 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 24 Jul, 2008 Users: 372 Jobs: 12990 Avg. exec. time: 2 secs Reviews & Citations Google/IEEE Avg. Review: Citations: 0
372 users, detailed statistics
31 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin
Simulates the dopant diffusion process in integrated circuit fabrication
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Process Lab: Oxidation
- This resource has a 9.6 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 24 Jul, 2008 Users: 427 Jobs: 15540 Avg. exec. time: 25 mins Reviews & Citations Google/IEEE Avg. Review: Citations: 0
427 users, detailed statistics
19 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin
Simulates the oxidation process in integrated circuit fabrication
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Process Lab: Oxidation Flux
- This resource has a 5.9 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 24 Jul, 2008 Users: 234 Jobs: 2206 Avg. exec. time: 2 hours Reviews & Citations Google/IEEE Avg. Review: Citations: 0
234 users, detailed statistics
19 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin
Simulates the oxidation flux in the oxide growth process in integrated circuit fabrication
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Process Lab: Point Defect Coupled Diffusion
- This resource has a 5.1 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 24 Jul, 2008 Users: 139 Jobs: 1155 Avg. exec. time: 2 secs Reviews & Citations Google/IEEE Avg. Review: Citations: 0
139 users, detailed statistics
31 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin
Simulates the point-defect-coupled diffusion process in integrated circuit fabrication