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Contributors: View

Peter Griffin

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Contributions 4 (detailed usage)
Affiliation Stanford University

Contributions

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Results 1 - 4 of 4

  1. Process Lab: Concentration Dependent Diffusion

    This resource has a 9.5 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 07 Oct, 2008
    Users: 378
    Jobs: 13040
    Avg. exec. time: 2 secs
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    378 users, detailed statistics

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    31 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the dopant diffusion process in integrated circuit fabrication

  2. Process Lab: Oxidation

    This resource has a 9.9 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 07 Oct, 2008
    Users: 440
    Jobs: 15620
    Avg. exec. time: 26 mins
    Reviews & Citations
    Google/IEEE
    Avg. Review: 5.0 out of 5 stars
    Citations: 0

    440 users, detailed statistics

    2 reviews (Review this)

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    19 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the oxidation process in integrated circuit fabrication

  3. Process Lab: Oxidation Flux

    This resource has a 6.5 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 07 Oct, 2008
    Users: 235
    Jobs: 2210
    Avg. exec. time: 2 hours
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations: 0

    235 users, detailed statistics

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    19 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the oxidation flux in the oxide growth process in integrated circuit fabrication

  4. Process Lab: Point Defect Coupled Diffusion

    This resource has a 5.5 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

    Usage Stats
    Overall Period: Updated 07 Oct, 2008
    Users: 140
    Jobs: 1159
    Avg. exec. time: 2 secs
    Reviews & Citations
    Google/IEEE
    Avg. Review: 3.0 out of 5 stars
    Citations: 0

    140 users, detailed statistics

    1 review (Review this)

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    31 Oct. 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the point-defect-coupled diffusion process in integrated circuit fabrication

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Results 1 - 4 of 4