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Eric Stach
| Contributions | 33 (detailed usage) |
|---|---|
| Affiliation | Purdue University, West Lafayette |
| Web Site | https://engineering.purdue.edu/MSE/Fac_Staff/Faculty/stach.html |
| Biography | Professor Eric Stach received a BS degree in Mechanical Engineering and Materials Engineering from Duke University in 1992. In 1994, he received his M.S. from the University of Washington and in 1998 he received his PhD from the University of Virginia, both in Materials Science and Engineering. He joined Lawrence Berkeley National Laboratory in Berkeley, CA where he was a Materials Staff Scientist at the National Center for Electron Microscopy, and in 2003 became a Program Leader in the Metals Program, Materials Science Division. He began his career at Purdue in the School of Materials Engineering in January 2005. His research interests include high-resolution in-situ electron microscopy techniques to understand how nanometer lengths scales affect the fundamental mechanical, thermomechanical and electromechanical behavior of materials |
Contributions
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Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 206 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
206 users
17 Mar. 2006 | Online Presentations | Contributor(s): Eric Stach
Electron and ion microscopy techniques allow one to obtain high spatial resolution images and spectroscopic information of both the surface and internal structure of nanostructured materials. In this tutorial, I will present a broad overview of the basic physical principles that underly the …
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MSE 582 Lecture 10: Diffraction Contrast Imaging
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13 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 80 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
80 users
14 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 12: Analytical Electron Microscopy
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15 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 1: Introduction
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115 users
28 Jan. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
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92 users
28 Jan. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 4: The Instrument, Part 1
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 75 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
75 users
28 Jan. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 4: The Instrument, Part 2
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 78 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
78 users
28 Jan. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 5: Electron Detection
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 66 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
66 users
04 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 6: Vacuum Science in EM
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80 users
28 Jan. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 7: Sample Preperation
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11 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 8: Electron Scattering
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11 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 9: Diffraction
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11 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Transmission Electron Microscopy Skills
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 169 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
169 users
28 Jan. 2008 | Courses | Contributor(s): Eric Stach
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MSE 640 Lecture 11: Diffraction contrast imaging
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29 May. 2008 | Online Presentations | Contributor(s): Eric Stach
Thickness fringes, Bend contours, Planar faults
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MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
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29 May. 2008 | Online Presentations | Contributor(s): Eric Stach
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
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MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
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29 May. 2008 | Online Presentations | Contributor(s): Eric Stach
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
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MSE 640 Lecture 13: Diffraction contrast imaging
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29 May. 2008 | Online Presentations | Contributor(s): Eric Stach
Weak beam dark field imaging, Simulation of diffraction contrast
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MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
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29 May. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
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29 May. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 640 Lecture 17: STEM Imaging
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27 May. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 640 Lecture 18: X-ray production in the TEM
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28 May. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
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28 May. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
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28 May. 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 640 Lecture 2: Elastic Scattering, Part 1
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Usage Stats Last 12 Months: updated 01 Jun, 2008 Users: 51 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
51 users
25 Feb. 2008 | Online Presentations | Contributor(s): Eric Stach
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