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Arvind Raman
| Contributions | 6 |
|---|---|
| Affiliation | Purdue University, West Lafayette |
| Web Site | http://meweb.ecn.purdue.edu/~dssl/ |
| Biography | Arvind Raman is Associate Professor in the School of Mechanical Engineering and the Birck Nanotechnology Center at Purdue University. He joined Purdue as an Assistant Professor in 2000. Earlier he earned his PhD from the University of California, Berkeley (1999), an MSME from Purdue (1993) and a B. Tech from the Indian Institute of Technology, Delhi (1991). His interests lie in predicting and exploiting nonlinear dynamical phenomena in micro and nanosystems, and in coupled fluid-structural systems. Raman received the NSF CAREER award in 2002, the Purdue Teaching for Tomorrow award (2003), the Discovery in Mechanical Engineering award (2004), the College of Engineering's Outstanding Young Researcher award (2006), and is currently the BFS Shafer faculty fellow in Mechanical Engineering. He serves as associate editor of the Journal of Fluids and Structures and of the ASME Journal of Applied Mechanics, and as Vice Chair of the Technical Committee on Micro- and Nanosystems in the ASME's Design Engineering Division. |
Contributions
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Atomic Force Microscopy
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Usage Stats Last 12 Months: updated 01 May, 2008 Users: 591 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
29 Nov. 2005 | Online Presentations | Contributor(s): Arvind Raman
Atomic Force Microscopy is has become an indispensible tool in nanoscience for the fabrication, metrology, manipulation and property characterization of nanostructures. In this tutorial, we will review the physics of the interaction forces between the nanoscale tip and sample, the dynamics …
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Fine Tuning Microcantilever Vibrations for Ultrasensitive Analyte Mass Detection
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Usage Stats Last 12 Months: updated 01 May, 2008 Users: 25 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
01 Sep. 2005 | Online Presentations | Contributor(s): Arvind Raman
Microcantilever based biochemical sensing has shown tremendous promise for ultrasenstive detection in both liquid and ambient conditions. However improving the sensitivity, reliability and robustness of these sensors so they can achieve their potential needs substantial efforts in (a) chemical …
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Introduction to VEDA: Virtual Environment for Dynamic AFM
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Usage Stats Last 12 Months: updated 01 May, 2008 Users: 103 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
26 Sep. 2007 | Learning Modules | Contributor(s): Arvind Raman
This learning module describes the motivation, theory, and features of VEDA- a Virtual Environment for Dynamic Atomic Force Microscopy for the accurate simulation of dynamic AFM on organic and inorganic surfaces. Following the motivation and theory, two specific examples are illustrated, …
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SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
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Usage Stats Last 12 Months: updated 01 May, 2008 Users: 37 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
08 Feb. 2007 | Online Presentations | Contributor(s): Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM [1] are becoming increasingly clear. Nonlinear …
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VEDA: Amplitude Modulated Scanning
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Usage Stats Last 12 Months: Updated 16 May, 2008 more › Users: 118 Jobs: 517 Avg. exec. time: 3 mins Reviews & Citations Google/IEEE: updated 28 Apr, 2008 Avg. Review: Citations: 1
30 Apr. 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman
Simulates amplitude modulated AFM scans over specified geometric features with heterogeneous material properties.
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VEDA: Dynamic Approach Curves
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Last 12 Months: Updated 16 May, 2008 more › Users: 80 Jobs: 486 Avg. exec. time: 2 mins Reviews & Citations Google/IEEE: updated 28 Apr, 2008 Avg. Review: Citations: 3
15 Mar. 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman
Simulates the dynamics of the nanoscale tip of an oscillating AFM cantilever as it approaches a sample.