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Events

  nano 501: Understanding approach curves and scanned images in tapping mode AFM
Description: Arvind Raman

Much information about the tip-sample material properties is buried in the amplitude and phase vs distance curves that are routinely acquired in tapping mode AFM. We will illustrate this with some example problems using the Dynamic Approach Curves (DAC) tool under VEDA- Virtual Environment for Dynamic AFM. Following this, we will use a few examples using the Amplitude Modulated Scanning (AMS) tool under VEDA to understand how imaging feedback parameters influence quality of images.
When: Monday, September 24 2007, 2:30pm - 3:30pm
Where: EE 317, Purdue University
Website: http://www.nanoHUB.org/education/nanotechnology501
Submitted by:  Alicia Goodman