Introduction

2dreflect offers two main functions:

    - Simulation of the reflectance spectra of a customized stack of 2D materials

    - Thickness labeling using model-based spectral image analysis

Major features

Simulation:

    - User-defined stack of up to 5 films, one material with an arbitrary thickness in each film

    - 2D materials available in each film in the stack: MoS2, WS2, MoSe2, WSe2, hBN and graphene

    - Thickness dependency of n, k of TMDCs (MoS2, WS2, MoSe2 and WSe2) is automatically taken into account when film thickness is specified 

    - Multiple spectra can be displayed on the same plot for convenient comparison

Thickness labeling:

    - Thickness of interest, +/- 1 monolayer, are highlighted if they appear in the field of view

    -  Labeling based on up to 3 spectral images (user specifies the central wavelength for each image)

    - Convenient switching between label map and error map to evaluate the fidelity of the labels

Please refer to the User Guide for more information.

MATLAB AppDesigner

Li, Wan, et al. "Direct optical visualization of graphene and its nanoscale defects on transparent substrates." Nano letters16.8 (2016): 5027-5031.

Researchers should cite this work as follows:

• Vu Nguyen, Wan Li, Ke Xu and Hayden Taylor (2019), "2D material reflectance spectra" 

• Vu Dang Nguyen, Yunsu Park, Darren K Adams, Hayden Taylor (2020), "2D material reflectance spectra," https://nanohub.org/resources/2dreflect. (DOI: 10.21981/04NF-EM42).

  BibTex | EndNote

1. 2D materials and devices
2. 2D materials characterization
3. 2D material stacks
4. material properties
5. nanoelectronics
6. nanoMFG Node
7. optical and electronic properties of 2D materials
8. optical properties